The silicon-supported samples were analysed by atomic force microscopy (AFM) in contact mode by means of an AutoProbe CP instrument from Park Scientific Instruments. Size scan varied between 1 and 5 ^m. A cantilever with a 0.05 N/m force constant and a 22 kHz resonant frequency was used.
Thermogravimetric analyses (TGA) were performed on a DuPont Thermal Analyser 951, with a heating ramp of 10°C min-1 until 1000°C, under airflow of 100 mL min-1. Infrared (IR) spectra were recorded by using a Nicolet 5SX FTIR spectrophotometer, in air at an atmospheric pressure of 560 Torr and at room temperature. Raman spectra were recorded by using a Thermo-Nicolet Almega Dispersive Raman instrument (X=532 nm) under the same conditions.
UV-Visible spectra were recorded on an Analytical Instruments Model DT 1000CE spectrophotometer. X-Ray diffraction patterns were obtained on a Siemens D5000 instrument (0.010° step, 0.6 s step time, 29 range 2-70°, Cu Kp radiation).
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