Fig. 1. X-ray diffraction from a Cu-Ni strained-layer superlattice grown on Cu(100). The inset figure shows an expanded version of the (200) scattering envelope with the intensity shown on a logarithmic scale to reveal higher-order satellites. The multilayer was 2.4 |om thick.
This demonstrates that the compositional modulation is oriented exclusively in the <100> direction while the superlattice lines reflect the periodicity and quality of the multilayer. The materials are typically grown from a nickel-based electrolyte containing -10 mmol/1 copper ions. The copper layer is deposited under diffusion-limited conditions while the nickel layer is grown under charge transfer control . A programmed coulometer is used to switch the potentiostat between the appropriate potentials thereby building the multilayer. To obtain more insight into the relevant electrocrystallization reactions an in-situ STM study has been initiated. In this report our findings for copper and nickel deposition on Cu(100) are presented.
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