Introduction

Over the last ten years a large effort has been focused on the synthesis and characterization of compositionally modulated alloys [1]. These materials offer several enhanced properties, ranging from hardness to enormous magnetoresistance. Metallic superlattices of Cu-Ni the most studied system due largely to the fact that Cu and Ni have the same face-centered cubic (fee) crystal structure and similar lattice parameters, with -2.6 % misfit. Furthermore, copper and nickel represent two of the most common electroplated coatings. Consequently, we have undertaken a study of the growth and properties of electrodeposited Cu-Ni multilayers as a function of the modulation orientation. Control of the modulation orientation may be pursued by taking advantage of the epitaxial constraint imposed by single-crystal or highly textured substrates. In fact, single-crystal Cu-Ni multilayers have been successfully grown on Cu(100) (2) as shown in Fig. 1, where X-ray scattering from (200) planes of the multilayer and the substrate is apparent.

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