Thickness Dependence 321 Lattice Parameters

The influence of the thickness (t) is primary seen upon the lattice parameters of the films (in-plane and out-of-plane parameters). Usually, the volume of the unit cell is conserved in the thin film as compared to the bulk. In order to verify this result, the evolution of the three-dimensional strain states and on crystallographic domain structures was studied on epitaxial Laa8Caa2MnO3 as a function of lattice mismatch with two types of (001)-substrates, SrTiO3 and LaAlO3 [140]. Surprisingly, it was shown, using normal and grazing incidence X-ray diffraction techniques, that the unit cell volume is not conserved and varies with the substrate as well as the film thickness (Fig. 14).

But the main result is that for a tensiled film (under expansion in the plane of the substrate), the out-of plane and in-plane parameters gradually increase and decrease,

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